报告详情
Investigation of Initial Electronic Structure of Materials Based on Ultraviolet Photoelectron Yield Spectroscopy
编号：24
访问权限：仅限参会人
更新：2025-11-10 10:56:29 浏览：31次
口头报告
报告开始：2025年11月22日 14:20（Asia/Shanghai）
报告时间：10min
所在会场：[S3] Parallel Session 3 [S3-1] Parallel Session 3-22 PM
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摘要
Ultraviolet photoelectron yield spectroscopy (PYS) serves as a powerful surface-sensitive technique for functional material design, device performance optimization, and failure mechanism analysis. By providing indirect access to the initial-state electronic density of states (DOS), PYS enables the detection of weak energy levels within discontinuous valence bands and gap states. Based on Spicer’s three-step photoemission model, a quantitative relationship has been established between the derivative of the photoelectron yield spectrum and the initial state DOS. The PYS measurement was conducted on a high-purity (≥99.99%) clean gold standard sample, and the initial-state DOS was calculated from the yield spectrum. The valence band structure of Au in its initial state was successfully characterized with a width of 3.6 eV. This work demonstrates the feasibility of using PYS as a quantitative tool for probing the intrinsic electronic structure of materials, which contributes a lot to the exploration of future semiconductor material charge carrier transport mechanisms and the optimization of device performance hold significant importance.
关键词
Initial Electronic Structure ,,Ultraviolet Photoelectron Yield Spectroscopy,density of states
报告人
Xiaohan Hou
None Xi'an Jiaotong University稿件作者
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重要日期
-
会议日期
11月21日
2025
至11月23日
2025
-
10月20日 2025
初稿截稿日期
-
11月23日 2025
注册截止日期
主办单位
IEEE Instrumentation and Measurement Society
South China University of Technology
South China University of Technology
承办单位
South China University of Technology
联系方式
- Icsmd
- ic******@163.com
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