报告详情
Research progress of high resolution electron energy loss spectroscopy
编号：30
访问权限：仅限参会人
更新：2025-11-10 11:01:30 浏览：14次
口头报告
报告开始：2025年11月22日 15:20（Asia/Shanghai）
报告时间：10min
所在会场：[S3] Parallel Session 3 [S3-1] Parallel Session 3-22 PM
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摘要
As a highly sensitive electronic structure analysis technology, electron energy loss spectroscopy (EELS) has become an important characterization method in materials science and condensed matter physics. By analyzing the energy loss caused by the inelastic scattering of electrons in the process of interaction with matter, this technology can obtain multi-level information on the composition of material elements, chemical bonding state, valence state distribution and local surface plasmon excitation. In recent years, with the rapid development of microscopic imaging resolution, spectral energy resolution and spectral analysis algorithms, EELS instruments and detection methods have made significant progress. EELS technology is mainly divided into two types : projection (TEELS) and reflection (REELS). Based on the brief introduction of the basic principle of high-resolution EELS, this paper systematically reviews the research and development progress of typical instruments in recent years, including the application of high-stability monochromators, the optimization design of high-resolution detectors, and the construction and application of time-resolved and momentum-resolved EELS experimental platforms. Finally, some representative research results are explained and analyzed to provide a systematic reference for relevant researchers, and the development trend and application prospect of EELS in future materials and surface science research are prospected.
关键词
electron energy loss spectroscopy,energy resolution,monochromator,high-resolution imaging
报告人
Linhuan Wei
student Xi'an Jiaotong University稿件作者
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重要日期
-
会议日期
11月21日
2025
至11月23日
2025
-
10月20日 2025
初稿截稿日期
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11月23日 2025
注册截止日期
主办单位
IEEE Instrumentation and Measurement Society
South China University of Technology
South China University of Technology
承办单位
South China University of Technology
联系方式
- Icsmd
- ic******@163.com
历届会议
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2023年11月02日 中国 China
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2023年11月02日 中国 Xi'an
2023 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2022年11月30日 中国 Harbin
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2021年10月21日 中国 Nanjing
2021 International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence -
2020年10月15日 中国 Xi'an
International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence
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