报告详情
Design of High-resolution Inverse Photoemission Spectroscopy System
编号：36
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更新：2025-11-10 11:05:18 浏览：23次
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报告开始：暂无开始时间（Asia/Shanghai）
报告时间：暂无持续时间
所在会场：[暂无会议] [暂无会议段]
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摘要
Inverse photoemission spectroscopy is an important method for studying the surface electronic structure of materials. It can reveal the conduction band structure of a material. Combined with photoemission spectroscopy, complete electronic structure information can be obtained. Therefore, it is a crucial scientific instrument for characterizing the detailed electronic structure of a material across energy bands. In recent years, with the continuous advancement of materials science and surface physics, the demand for high-resolution inverse photoemission spectroscopy has continued to increase. This thesis first introduces the basic theory of inverse spectroscopy. Then, a high-resolution inverse photoemission spectroscopy system based on a sector-shaped deflection energy analyzer and a monochromator was designed, and its theoretical energy resolution was calculated. Finally, future research priorities for inverse spectroscopy are outlined to provide a reference for subsequent related research.
关键词
inverse photoemission spectroscopy,high-resolution,low energy,energy analyzer,monochromator
报告人
Sichao Zhang
student Xi’an Jiaotong University稿件作者
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重要日期
-
会议日期
11月21日
2025
至11月23日
2025
-
10月20日 2025
初稿截稿日期
-
11月23日 2025
注册截止日期
主办单位
IEEE Instrumentation and Measurement Society
South China University of Technology
South China University of Technology
承办单位
South China University of Technology
联系方式
- Icsmd
- ic******@163.com
历届会议
-
2023年11月02日 中国 China
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2023年11月02日 中国 Xi'an
2023 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2022年11月30日 中国 Harbin
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2021年10月21日 中国 Nanjing
2021 International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence -
2020年10月15日 中国 Xi'an
International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence
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