报告详情
Functional Analysis and Standards Research on Electronic Fuses (Semiconductor Fuses)
编号：24
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更新：2026-09-28 23:34:57 浏览：2次
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报告时间：暂无持续时间
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摘要
An electronic fuse (eFuse) implements current limiting or fault interruption through current sensing, control logic, and power-semiconductor switches, and may integrate overvoltage protection, thermal shutdown, inrush-current suppression, reverse-current blocking, and status reporting. Its protection mechanism, recoverability, and system integration differ from those of conventional fuses that operate by melting a fuse element. IEC 60127, IEC 62368-1, UL 2367, and IEC 60947-10 address miniature fuse-links, IC current limiters, solid-state overcurrent protectors, and semiconductor circuit-breakers, respectively; however, they differ in scope and assessment objectives, and no unified product-level framework currently covers board-level low-voltage DC eFuses. By comparing standard clauses and analyzing representative protection modes, this paper discusses the product definition, ratings, protection modes, and test boundaries of eFuses, and proposes a test system centered on continuous-current carrying, overcurrent, short-circuit, repeated operation, and post-test functional verification. The results provide technical support for the development of a national standard and future proposals for international standardization.
关键词
electronic fuse,solid-state protection,semiconductor switch,overcurrent protection,short-circuit test,international standardization
报告人
Cai Jun
Professor Senior Eng China National Electric Apparatus Research Institute Co.,Ltd.稿件作者
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重要日期
-
会议日期
10月25日
2026
至10月27日
2026
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09月15日 2026
初稿截稿日期
主办单位
Xi’an Jiaotong University
联系方式
历届会议
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2026年10月25日 中国 Xi'an
2026 12th International Conference of Electric Fuses and their Applications (ICEFA) -
2024年09月16日 中国 选择城市
12th International Conference of Electric Fuses and their Applications
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