Intelligent Identification of UV Aging States in Asphalt Based on Multi-Source Microscopic Features and Machine Learning
编号:32 访问权限:仅限参会人 更新:2026-09-15 11:11:18 浏览:1次 口头报告

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摘要
In road engineering, UV radiation accelerates chemical oxidation and performance degradation during long-term service. This study proposed a machine learning-based framework for intelligent identification of UV aging states in asphalt using multi-source microscopic features. SBS modified asphalt was subjected to different UV aging durations. The conventional performance, rheological behavior, and microscopic characterization tests were used to investigate the performance of UV aged asphalt. Based on the Pearson correlation analysis, the four representative microscopic parameters, including carbonyl index (IC=O), sulfoxide index (IS=O), polydispersity index (PDI), and large molecular size fraction (LMS), were selected to construct a multi-source microscopic feature set. Subsequently, a linear Support Vector Machine (SVM) model combined with Leave-One-Out Cross-Validation (LOOCV) was developed for UV aging state classification. The results showed that the proposed model achieved an accuracy and balanced accuracy of 83.3%, with a macro-F1 score of 82.2%. Feature contribution analysis indicated that LMS and IS=O were the dominant variables for aging state identification, with a cumulative contribution of 62.6%. Furthermore, the predicted aging categories exhibited consistent trends with experimentally measured performance degradation. The proposed framework establishes the relationship among microscopic structural features, aging states, and service performance deterioration, providing a physically interpretable data-driven approach for intelligent evaluation of asphalt UV aging states.
关键词
Machine learning,Support Vector Machine,Aging state identification,Engineering
报告人
Jing Hu
Dr. Tongji University

稿件作者
Jing Hu Tongji University
Zihao Ju National Key Laboratory of Green and Long-Life Road Engineering in Extreme Environment (Changsha)
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重要日期
  • 会议日期

    11月06日

    2026

    11月08日

    2026

  • 10月15日 2026

    初稿截稿日期

主办单位
IEEE Instrumentation and Measurement Society
承办单位
Sichuan University
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