A Physics Informed and Explainable Deep Learning Framework for Thermal Image Based Transformer Fault Severity Diagnosis with a Leakage Safe Data Augmentation Robustness Study
编号:135 访问权限:仅限参会人 更新:2026-11-10 16:52:15 浏览:9次 Online

报告开始:2026年11月21日 13:15(Asia/Kolkata)

报告时间:15min

所在会场:[S7] Networking, Security and Blockchain Systems [S7-2] Networking, Security and Blockchain Systems

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摘要
Internal short circuit faults are among the most common causes of unexpected transformer failure, and infrared (IR) thermography gives a safe, non-contact way to catch such faults early. This paper presents a complete deep learning pipeline for thermal image based fault severity diagnosis, built and tested on a public benchmark of 255 IR images [15] of a 1 phase dry type transformer covering nine severity classes (Healthy plus eight levels of short circuited winding turns). The pipeline combines physics based thermal feature extraction, a compact convolutional neural network (CNN) classifier verified with Grad CAM, two label free severity estimators (a healthy only auto encoder and K means clustering), and a closed form severity index that needs no training at all. Because the dataset is small, the paper's main contribution is a leakage safe, three condition data augmentation stress test that compares no augmentation, on the fly augmentation, and a fixed offline 10× augmented set. All three models score a perfect 100% on a clean test set, but under a deliberately distorted 'stress test' their accuracy is 43.6%, 71.8%, and 97.4% respectively showing that clean test accuracy alone hides a large robustness gap. Physics features correlate strongly with true severity (Spearman ρ up to 0.983), and the label free estimators reach ρ = 0.987–0.989, nearly matching the supervised CNN while needing little or no fault labelled data. These results give utilities a practical, layered path to deploy thermal fault diagnosis even when labelled fault data is scarce.
关键词
Transformer fault diagnosis, infrared thermography, convolutional neural network, Grad CAM, data augmentation, robustness, auto encoder, K means clustering, severity index.
报告人
Gaurav Kumar Mittal
student National Institute of technical teachers training and research chandigarh/Punjab university

稿件作者
Gaurav Kumar Mittal National Institute of technical teachers training and research chandigarh/Punjab university
Ritula Thakur N.I.T.T.T.R. CHANDIGARH
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重要日期
  • 会议日期

    11月20日

    2026

    至

    11月22日

    2026

  • 10月31日 2026

    初稿截稿日期

  • 11月07日 2026

    提前注册日期

  • 11月22日 2026

    注册截止日期

主办单位
United Societies of Science
承办单位
Pondicherry University
协办单位
IEEE Section
IEEE Madras Section
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