An Optimized Parameter Design Method for Desaturation Protection Circuit towards Fast Response Speed and Strong Noise Immunity
IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia
Qian Cheng  Huazhong University of Science and Technology
Room2 /S5&S6 2021年08月27日 10:30~10:45
仅限参会人 口头报告
Modeling and comparison of switching loss between SiC MOSFETs with current source and voltage source gate driver
IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia
Zheng Quan   Huazhong University of Science and Technology,School of Electrical and Electronic Engineering
P /P3 2021年08月27日 12:25~12:30
公开 张贴报告
Design of Aging Test System for SiC MOSFET Modules
IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia
Shen Chaoyue  Shanghai University,School of Mechatronic Engineering and Automation
P /P4 2021年08月27日 12:35~12:40
公开 张贴报告
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询